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  • Winners 2009
  • The Development of a Portable Total Reflection X-ray Fluorescence Spectrometer with Picogram Sensitivity
Dr. Shinsuke Kunimura

The Development of a Portable Total Reflection X-ray Fluorescence Spectrometer with Picogram Sensitivity

Dr. Shinsuke Kunimura
P.h.D candidate(JSPS research fellow (DC2))

Kyoto University

*The organization and the title are those when awarded

Winners 2009
Archive Index
  • Winners 2009Surface Analysis for Semiconductor Related Materials
  • Development and Evaluation of an Innovative “Soft Ionization Technique” based on Atmospheric Pressure Glow Discharges Time-of-flight Mass Spectrometry (AP-GD-TOFMS) for the Determination of Inorganic/organic Contaminants on Semiconductor Surfaces
  • A challenge in ultra-trace analysis by X-ray fluorescence- Instrumentation of novel efficient wavelength-dispersive X-ray spectrometer and the application to TXRF experiments with brilliant synchrotrons
  • Study of O2, NO and CO reaction processes on silicon surfaces by means of surface differential reflectance and reflectance difference spectroscopy
  • The Development of a Portable Total Reflection X-ray Fluorescence Spectrometer with Picogram Sensitivity
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